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Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Oct 2014
|
32
(6),
06FC05
DOI: 10.1116/1.4901883
High-voltage energy dispersive x-ray spectrometry using a low-energy primary beam
Wu, Ying ;
Klyachko, Dimitri ;
Davilla, Scott ;
Spallas, James ;
Indermuehle, Scott ;
Muray, Lawrence P.
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